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Photosensitive Region Component – Computer, Electronic and Optical Product Manufacturing

Q: What determines the sensitivity of a photosensitive region?

Sensitivity is determined by quantum efficiency, pixel size, fill factor, and semiconductor material properties, with optimized designs achieving over 70% quantum efficiency in visible spectrum.

Q: How does temperature affect photosensitive region performance?

Higher temperatures increase dark current (thermal noise) and reduce signal-to-noise ratio, requiring cooling systems for precision applications to maintain <0.1 nA/cm² dark current.

Q: Can photosensitive regions be customized for specific wavelengths?

Yes, through material selection (e.g., silicon for visible, InGaAs for infrared) and anti-reflective coating optimization, spectral response can be tailored from 200 nm to 1700 nm.

Component Specifications

Definition

The photosensitive region is a critical component within a CCD (Charge-Coupled Device) detector array that consists of an array of photodiodes or photogates. When exposed to light, these elements generate electron-hole pairs proportional to the incident photon flux, creating an electrical charge that is subsequently transferred and converted into digital image data through the CCD's readout circuitry.

Working Principle

Operates on the photoelectric effect where incident photons strike semiconductor material (typically silicon), generating electron-hole pairs. The accumulated charge in each pixel is proportional to light intensity and exposure time, then transferred via potential wells created by applied voltages to output amplifiers for signal processing.

Materials

Single-crystal silicon substrate with doped regions (p-type/n-type), silicon dioxide insulating layers, polysilicon electrodes, and anti-reflective coatings (silicon nitride or titanium dioxide).

Technical Parameters

Pixel Size 3-30 μm
Fill Factor >90%
Dark Current <0.1 nA/cm² at 25°C
Dynamic Range >70 dB
Spectral Response 400-1100 nm
Quantum Efficiency >70% at 550 nm

Standards

ISO 12232, ISO 15739, DIN 58141-2

Industry Taxonomies & Aliases

Commonly used trade names and technical identifiers for Photosensitive Region.

Parent Products

This component is used in the following industrial products

CCD Detector Array

A photosensitive electronic component that converts light signals into electrical signals for detection and measurement in optical spectrometers.

View Product Details

Engineering Analysis

Risks & Mitigation

Quantum efficiency degradation over time
Dark current increase with temperature
Pixel defects from manufacturing
Charge transfer inefficiency
Blooming in high-light conditions

FMEA Triads

Trigger: Contamination during semiconductor processing
Failure: Dead pixels or reduced quantum efficiency
Mitigation: Cleanroom manufacturing with particle monitoring and automated optical inspection

Trigger: Electrostatic discharge during handling
Failure: Gate oxide breakdown and permanent damage
Mitigation: ESD-protected workstations, conductive packaging, and operator training

Trigger: Thermal stress from improper cooling
Failure: Increased dark current and reduced dynamic range
Mitigation: Active cooling systems with temperature monitoring and thermal interface optimization

Industrial Ecosystem

Compatible With

Interchangeable Parts

Compliance & Inspection

Tolerance

Pixel pitch tolerance ±0.1 μm, quantum efficiency variation <5% across array

Test Method

ISO 12232 for sensitivity measurement, dark current testing at multiple temperatures, modulation transfer function analysis

Procurement Evaluation Criteria

Not customer reviews or live demand data. These dimensions support RFQ preparation and supplier evaluation.

Technical documentation

4/5

Manufacturing capability

4/5

Inspection readiness

5/5

Supplier transparency

3/5

These scores are example evaluation dimensions, not real customer ratings, country-specific buyer feedback, or live inquiry activity.

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Frequently Asked Questions

What determines the sensitivity of a photosensitive region?

Sensitivity is determined by quantum efficiency, pixel size, fill factor, and semiconductor material properties, with optimized designs achieving over 70% quantum efficiency in visible spectrum.

How does temperature affect photosensitive region performance?

Higher temperatures increase dark current (thermal noise) and reduce signal-to-noise ratio, requiring cooling systems for precision applications to maintain <0.1 nA/cm² dark current.

Can photosensitive regions be customized for specific wavelengths?

Yes, through material selection (e.g., silicon for visible, InGaAs for infrared) and anti-reflective coating optimization, spectral response can be tailored from 200 nm to 1700 nm.

Can I contact factories directly?

Yes, each factory profile provides direct contact information.

Data Basis

CNFX manufacturer profiles, technical classification, publicly available product information, and ongoing plausibility checks.

Preliminary Technical Classification

This page supports structured research, RFQ preparation, and supplier evaluation. It does not replace buyer-led supplier qualification, standards review, or technical approval.

Photosensitive Region