INDUSTRY COMPONENT

D Flip-Flop Cell

A D flip-flop cell is a fundamental digital storage component that captures and holds a single bit of data on a clock edge, used in sequential logic circuits.

Component Specifications

Definition
A D flip-flop cell is a bistable multivibrator circuit element that stores one binary bit (0 or 1). It features a data input (D), a clock input (CLK), and outputs (Q and Q'). The cell captures the value present at the D input at the moment of a specified clock transition (typically rising or falling edge) and holds it stable at the Q output until the next clock event. It forms the basic building block for registers, counters, and memory elements in digital systems like the D Flip-Flop Array machine.
Working Principle
The D flip-flop operates on edge-triggered clocking. When the clock signal transitions (e.g., from low to high), the logic level at the D input is sampled and transferred to the Q output. This value remains latched, unaffected by changes at D, until the next clock edge. Internally, it often uses cross-coupled gates (like NAND or NOR) to create feedback that maintains state.
Materials
Semiconductor materials: Silicon (Si) with dopants (e.g., boron, phosphorus) for transistors; dielectric layers (e.g., silicon dioxide); metal interconnects (e.g., aluminum, copper). Packaging: Ceramic or plastic encapsulant with lead frames or solder balls.
Technical Parameters
  • Hold Time 30 ps
  • Setup Time 50 ps
  • Output Drive 4 mA
  • Power Supply 1.2 V
  • Clock Frequency Up to 5 GHz
  • Propagation Delay 100 ps
  • Operating Temperature -40°C to 125°C
Standards
ISO 9001, IEC 60747, JEDEC JESD78

Industry Taxonomies & Aliases

Commonly used trade names and technical identifiers for D Flip-Flop Cell.

Parent Products

This component is used in the following industrial products

Engineering Analysis

Risks & Mitigation
  • Clock skew causing timing violations
  • Metastability from asynchronous inputs
  • Power supply noise affecting stability
  • Electrostatic discharge (ESD) damage
FMEA Triads
Trigger: Clock signal delay variation
Failure: Setup or hold time violation
Mitigation: Use balanced clock tree synthesis and timing analysis tools
Trigger: Voltage spike on power rail
Failure: Data corruption or latch-up
Mitigation: Implement decoupling capacitors and robust power distribution

Industrial Ecosystem

Compatible With

Interchangeable Parts

Compliance & Inspection

Tolerance
±5% for timing parameters, ±10% for voltage levels
Test Method
Automated test equipment (ATE) with vector patterns, scan chain testing, and boundary scan (JTAG)

Procurement Evaluation Criteria

Not customer reviews or live demand data. These dimensions support RFQ preparation and supplier evaluation.

Technical documentation
4/5
Manufacturing capability
4/5
Inspection readiness
5/5
Supplier transparency
3/5

These scores are example evaluation dimensions, not real customer ratings, country-specific buyer feedback, or live inquiry activity.

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Frequently Asked Questions

What is the difference between a D flip-flop and a latch?

A D flip-flop is edge-triggered, capturing data only on a clock transition, while a latch is level-sensitive, transparent when the enable signal is active, making flip-flops better for synchronous design.

How is a D flip-flop cell used in a D Flip-Flop Array machine?

Multiple D flip-flop cells are integrated into an array to form registers or memory blocks, enabling parallel data storage and processing in digital systems like CPUs or FPGAs.

Can I contact factories directly?

Yes, each factory profile provides direct contact information.

Data Basis

CNFX manufacturer profiles, technical classification, publicly available product information, and ongoing plausibility checks.

Preliminary Technical Classification
This page supports structured research, RFQ preparation, and supplier evaluation. It does not replace buyer-led supplier qualification, standards review, or technical approval.

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D Flip-Flop Array Data buffer